This course provides a detailed overview of important characterization techniques used to study the electrical, optical, magnetic, and piezoelectric properties of thin films, with an emphasis on semiconductors, for device applications. Key properties that can be extracted from each technique will be described and compared. Important models to extract key materials characteristics from raw data collected through ex situ and in situ techniques will also be introduced. This course emphasizes characterization techniques commonly available in modern laboratory settings and in industry.

Repeat Rules

Course is not repeatable for credit.